Test Pattern generation has long been carried out by using conventional Linear Feedback Shift Registers (LFSR’s). Index Terms - C17 BENCHMARK, CUT, FAULTCOVERAGE, LFSR. The experimental results for c17 benchmark, with and without fault confirm the fault coverage of the circuit being tested. The goal of having intermediate patterns is to reduce the transitional activities of Primary Inputs (PI) which eventually reduces the switching activities inside the Circuit under Test (CUT) and hence power consumption is also reduced without any penalty in the hardware resources. The Power Optimization of Linear Feedback ShiftĪbstract- A new fault coverage test pattern generator using a linear feedback shift register (LFSR) called FC-LFSR can perform fault analysis and reduce the power of a circuit during test by generating three intermediate patterns between the random patterns by reducing the hardware utilization. International Journal of Scientific & Engineering Research, Volume 5, Issue 9, September-2014 917 The Power Optimization of Linear Feedback Shift Register Using Fault Coverage Circuits
